— Sireesha B.
To answer your question, I turned to the experts at Impinj, which manufactures ultrahigh-frequency (UHF) RFID chips for transponders. Here is the company’s response.
* * *
If online die testing is performed, this happens at the pre-diced wafer level. The test arrays are probed at the probing station.
The states you mentioned are programmed into the tester—which, in turn, exercises the protocol to test timing-link parameters and other crucial functions.
If, on the other hand, online inlay testing is performed, a certified Gen 2 RFID reader, such as Impinj’s Speedway Revolution model, is used, and is usually installed at the end of the assembly line.
The readers exercise macros using a Low-Level Reader Protocol (LLRP) to assemble different commands and functions with which the inlay will be tested.
If further low-level control becomes necessary, there are off-the-shelf testing systems that allow the user individual command control.
—Mark Roberti, Founder and Editor, RFID Journal
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