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Microsoft COO Kevin Turner to Deliver Keynote Address at EPC Connection

EPCglobal North America and RFID Journal announced today that Turner will speak at the conference and exhibition, to be held in Chicago on Oct. 2-4.
By Alexander C.H. Skorna and André Richter
In 1995, at the age of 29, Turner became the youngest corporate officer Wal-Mart had ever named, and in 1997, with worldwide responsibility for all application development and support at Wal-Mart, Turner received the first "Sam M. Walton—Entrepreneur Of The Year" award, the highest honor given at Wal-Mart, determined by a vote of the Walton family. Turner has also received various honors from such magazines as Time, Fortune, Business 2.0 and CIO.

"We are very pleased to have someone with Kevin Turner's knowledge and experience presenting at EPC Connection," says Mark Roberti, founder and editor of RFID Journal. "Kevin was actually CIO at Wal-Mart when the retailer began to seriously explore RFID's potential, so he understands both the business imperatives of the technology and the technological requirements needed to achieve RFID's benefits."

EPC Connection will offer four educational tracks: Supply Chain/Inventory Management, IT/Infrastructure, Manufacturing and Distribution/Logistics. It will also feature three preconference seminars: EPC Essentials, RFID in Packaging and the sixth RFID Academic Convocation, highlighting the latest research on RFID applications.

In addition, the event will highlight new case studies and objective end-user presentations from numerous companies, including Ahold, AmerisourceBergen, Boeing, Cephalon, Coca-Cola, Dow Chemical, Dow Corning, Kimberly-Clark, Lockheed Martin, Northrop Grumman, Rolls-Royce, Schiff Nutrition, Shaw Industries, Technicolor, Wal-Mart and Wilson Sporting Goods.

"RFID Journal has always been committed to providing the highest-quality information about radio frequency identification, and helping companies understand the benefits of EPC technologies is a big part of that," Roberti says. "This event will feature the same high-quality presentations for which RFID Journal's other events are well-known."

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