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By Rich Handley

CISC Semiconductor Releases Compact Test Equipment for RFID

CISC Semiconductor has announced the release of its RFID Xplorer. The compact, high-precision RFID test instrument is used to measure the performance of RFID devices and application setups, the company reports. The device can also verify conformance and support the development of readers, tags and ICs.

According to the company, the RFID Xplorer was developed to be easily applied for tag frequency sensitivity, communication range and backscatter measurements, with a receiver sensitivity of -90 dBm. The device operates with at least 2 W e.r.p. in the basic frequency range from 800 MHz to 1 GHz. The extended frequency range is from 600 MHz to 1.3 GHz. The measurement speed achieved can be as low as 1 second per frequency.

CISC's RFID Xplorer
Also known as Xplorer 200, the RFID Xplorer features extended read and write memory tests, as well as test support for crypto suites fully supporting the EPCglobal and ISO/IEC test standards. Xplorer 200 can also meet all Brazil RFID test standards, such as SINIAV, ARTESP and Brasil ID, and can be used to measure both standalone tags and those applied to products. In addition, it can perform a complete analysis of multiple tags.

Measuring 160 millimeters by 205 millimeters by 50 millimeters (6.3 inches by 8 inches by 2 inches), the RFID Xplorer allows flexibility and easy transport, the company indicates, and dismantling and setup can be accomplished within minutes. The device is designed for open-area tests and as a high-precision solution for measurements in an RF-controlled environment using portable or fixed RF test chambers.

The system comes with software and a reference tag for self-calibration. The test equipment can be controlled via a graphical user interface. An additional application programming interface allows for the development of user-defined test sequences within standard development environments.

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