Mar 03, 2013Joseph Pearson and Dr. Ted Moise of Texas Instruments explain the advantages of embedding Ferroelectric Random Access Memory (FRAM)-based memory for smart ICs, as compared to traditional memory technologies currently used in many e-passport and government ID programs.
FRAM-Based Smart ICs for Government Electronic IDs
SEND IT YOUR WAY
ASK THE EXPERTS
ASK A QUESTION FOR OUR EXPERTS
ASK THE EXPERTS
View previous question answers »