Jan 09, 2019RFID Journal has announced that the IEEE RFID 2019 conference will be featured as a co-located event in conjunction with this year's RFID Journal LIVE! conference and exhibition—an event focused on radio frequency identification (RFID) and its many business applications. LIVE! 2019 and IEEE RFID 2019 will be held on Apr. 2-4 at the Phoenix Convention Center, located in Phoenix, Ariz.
The IEEE's annual conference on RFID is the premier event for exchanging all RFID-related technical research. The conference attendees will include a mix of international practitioners and researchers from industry and academia, who will have the unique opportunity to share, discuss and witness research results in all areas of RFID technologies and their applications. Attendees will get face-to-face time with the top researchers and scientists working on RFID.
As in previous years, the IEEE RFID event will again feature a special Smart Cities Educational Mega-Challenge. Teams will be rated on how well they plan and evaluate a solution that incorporates RFID technology. Each team will choose a city and a problem it faces that can be addressed by a smart-city solution, then propose a system that includes the use of RFID. For more information, click here.
"RFID Journal LIVE! and IEEE RFID have been held in conjunction for the past 12 years," says Mark Roberti, RFID Journal's founder and editor. "The partnership has been beneficial for the entire RFID industry. Many of the RFID innovations we will see in the market throughout the next few years will come out of papers delivered at the IEEE RFID event."
LIVE! 2019 will also feature four industry-specific and four technical conference tracks, six in-depth preconference seminars and workshops, the RFID Journal Awards, fast-track RFID training provided by RFID4U, and RFID Professional Institute certification. What's more, the event will offer exhibits and demonstrations conducted by the industry's leading technology firms. For more information, visit www.rfidjournalevents.com/live.