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CompTIA to Close RFID Beta Exam
Those interested in being among the first to be certified as RFID experts have until Dec. 31 to take the test.
Dec 21, 2005—The Computing Technology Industry Association (CompTIA), a nonprofit organization that provides certification testing for the information technology industry, says it plans to close the beta test for CompTIA RFID+, the first radio frequency identification certification program, on Dec. 31. The purpose of the beta version is to help CompTIA refine the final test, which the organization is designing to serve as a standardized test for the RFID industry.
"As of mid-December, nearly 100 individuals had either taken the beta exam or had registered to do so," says David Sommer, CompTIA's vice president of e-commerce. "We'd like even more people to take the test so we can evaluate it and develop the best possible test for the RFID industry."
CompTIA Store, or at any VUE or Prometric testing center.
The RFID+ certification beta test must be taken in person at VUE and Prometric testing centers, located in most major cities worldwide. The beta exam consists of approximately 115 multiple-choice questions, written in English, and covers topics related to the installation, configuration and maintenance of RFID hardware and device software.
Test-takers will have about 120 minutes to answer all the questions. After taking the test, they will receive results by mail, sometime in April or May. To help prepare for the beta exam, certification candidates can download the RFID+ exam blueprint from CompTIA's Web site.
Foundation sponsors supporting the beta test include American RFID Solutions, the Association for Automatic Identification and Mobility (AIM Global), Briljent, DHL Express (USA), FC Business Systems, IBM, Indiana University-Purdue University Indianapolis, Intermec Technologies, International Paper's ASURYS division (formerly Smart Packaging), ODIN technologies, OTA Training, Printronix, RFID4U (a division of eSmart Source), RFID Focus, RFID Global Solutions and RFID Journal.
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